diffractometry
同义词释义
- 1)diffractometry[,difræk'tɔmitri],衍射测定法2)Measurement by diffraction,衍射法测量3)actinometry,日射测定法4)reflectometry,反射测定法5)diffraction measurement,衍射测量6)halometry,红细胞衍射晕测量<法>
用法例句
Measurement of Residual Stress of Cold Rolled Steel Strip by X-ray Diffraction Method
X射线衍射法测量冷轧带钢残余应力
A XRD Method to Measure Orientation of Single Crystal Superalloys
X射线衍射法测量单晶高温合金的取向
Measurement of the attenuation coefficient of surface acoustic wave by means of the light diffraction
衍射法测量低频液体表面波的衰减系数
Measurement of Surface Tension and Capillary Wave Velocity at Different Temperature by Laser Diffraction
激光衍射法测量表面张力和毛细波波速与温度的关系
Method of Measuring Small Rotating Angle Based on Slit Diffraction
基于单缝衍射原理的小转角测量方法
Research on Diameter Measurement Technique of Thin Cylinder by Laser Diffraction;
激光衍射法细圆柱体直径测量技术研究
Experiment of Defects self-height Measurement with Endpoint Diffraction Wave
端点衍射波法测量缺陷自身高度的实验
Retained austenite in steel--Quantitative determination--Method of X-ray diffractometer
GB/T8362-1987钢中残余奥氏体定量测定X射线衍射仪法
Study on Determination of the Weight Concertration of Free Silicon Dioxide for Dust by Using XRD Technique and the Rietveld Refinement Method;
X射线衍射-Rietveld全谱图拟合法测定粉尘中游离SiO_2含量的研究
Discussion on K Value Method of X-ray Diffraction Determining Calcite Content in Wollastonite;
X-射线衍射K值法测定硅灰石矿中方解石的含量
Performance of a soft x-ray splitter grating parallelism measuring system by diffraction method
衍射法X射线激光分束光栅平行度测量系统(英文)
Measuring Refractive Index of Liquor by Acoustooptic Diffraction
利用声光衍射测量甘草折射率的研究
The method for catalyst copper analysis was established, in which an effective measurement of trace content of elements with incremental mode by X-Ray diffraction fluorescence spectroscope was introduced.
建立了采用X射线衍射荧光光谱仪、过增量法测定铜催化剂中微量元素含量的方法。
A Study on the Influence of Overdrinking on Red Cell Deformability with Laser Diffraction
激光衍射法检测饮酒过量者红细胞变形性的改变
An Imaging Processing Method for Measuring the Array Position of Diffraction Spot of High Power Laser Beam
测量高功率激光束衍射光斑阵列位置的图象处理方法
Measuring Method for Topography of DOE Based on Dual-Path Two-Wavelength Phase Shifting Interferometric Microscopy
双光路双波长相移干涉显微法测量衍射光学元件形貌
Using CCD censor to receive the Laser diffraction and measure the precise slot width and round hole radius
利用CCD接收激光衍射的方法测量精密缝宽和圆孔直径
Measurement of Monochromator' s Angle Repeatability by Phase Plate Diffraction Collimation Method
单色仪转角重复精度的相位板衍射准直方法测量
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