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dummy wafer

中文翻译仿真晶圆,虚设晶圆

同义词释义

    1)dummy wafer,仿真晶圆,虚设晶圆2)450 mm wafer equipment,450mm晶圆设备3)wafer,晶圆4)wafer disk,晶圆圆盘5)epitaxial wafer,磊晶晶圆6)wafer breaking equipment,晶圆劈开设备

用法例句

    Evolution of Wafer-Surface Preparation for Semiconductor Industry;

    半导体产业中晶圆片表面处理的发展

    Critical Success Factors for High-Volume Wafer-level Solder Ball Placement

    大规模晶圆级焊球置放关键的成功因素

    The structural design of the wafer expansion device was put forward.

    该装置可完成片盒、内圈和外圈的输入和取片动作,实现扩晶过程张紧力的调节控制、分离晶圆和衬架、排出空片盒和废弃的衬架等。

    Mechanical Test Wafer- A silicon wafer used for testing purposes.

    机械测试晶圆片-用于测试的晶圆片。

    Ingot- A cylindrical solid made of polycrystalline or single crystal silicon from which wafers are cut.

    晶锭-由多晶或单晶形成的圆柱体,晶圆片由此切割而成。

    Process Test Wafer- A wafer that can be used for processes as well as area cleanliness.

    加工测试晶圆片-用于区域清洁过程中的晶圆片。

    tours Powerchip Semiconductor Corporation's twelve-inch wafer plant in ....County.

    赴…县参观力晶半导体十二吋晶圆

    Virgin Test Wafer- A wafer that has not been used in manufacturing or other processes.

    原始测试晶圆片-还没有用于生产或其他流程中的晶圆片。

    Flat- A section of the perimeter of a wafer that has been removed for wafer orientation purposes.

    平边-晶圆片圆周上的一个小平面,作为晶向定位的依据。

    Bonded Wafers- Two silicon wafers that have been bonded together by silicon dioxide, which acts as an insulating layer.

    绑定晶圆片-两个晶圆片通过二氧化硅层结合到一起,作为绝缘层。

    Haze - A mass concentration of surface imperfections, often giving a hazy appearance to the wafer.

    雾度-晶圆片表面大量的缺陷,常常表现为晶圆片表面呈雾状。

    Notch- An indent on the edge of a wafer used for orientation purposes.

    凹槽-晶圆片边缘上用于晶向定位的小凹槽。

    Bonding Interface- The area where the bonding of two wafers occurs.

    绑定面-两个晶圆片结合的接触区。

    Primary Orientation Flat- The longest flat found on the wafer.

    主定位边-晶圆片上最长的定位边。

    Hot plate with silicon wafer lowered to heating position.

    加热板与矽晶圆降低至加热位置。

    Slip- A defect pattern of small ridges found on the surface of the wafer.

    划伤-晶圆片表面上的小皱造成的缺陷。

    Mound- A raised defect on the surface of a wafer measuring more than0.25 mm.

    堆垛-晶圆片表面超过0.25毫米的缺陷。

    Pit- A non-removable imperfection found on the surface of a wafer.

    深坑-一种晶圆片表面无法消除的缺陷。

    Waviness- Widely spaced imperfections on the surface of a wafer.

    波纹-晶圆片表面经常出现的缺陷。

    Hot plate with silicon wafer in initial configuration (before heating).

    加热板与矽晶圆在启始状态(加热前)。

    Smudge- A defect or contamination found on the wafer caused by fingerprints.

    污迹-晶圆片上指纹造成的缺陷或污染。

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